Failure Analysis Equipment

Interfacing Adaptors

Semiconductor Failure analysis (FA) is the process of determining how or why a semiconductor device has failed. It is often perform as a series of steps known as FA techniques. Device failure is defined as any non-conformance of the device to its electrical and/or visual/mechanical specifications. Failure analysis is necessary in order to understand what caused the failure and how it can be prevented in the future.

Some of the FA equipment use in Failure analysis is:
- Scanning Electron Microscope (SEM)
- Acid Decapsulator
- Mechanical Decapsulator
- Laser Decapsulator
- Silicon Backside Preparation System